Bulk Material Testing
We evaluate solid bulk material three dimensions at both compositional and trace levels. The materials can be in the forms of ingot, wafer, coupon, chunk, small electric device, wire, or powder.
Since 1975 We have experience characterizing a variety of bulk materials, both inorganic and organic in nature, for semiconductor, photovoltaic, disk drive, nanotech, defense, and biomedical industries.
Analyses Provided
- Compositional analysis
- Depth profiling, line scan and three-dimensional mapping
- Microscopic or local analysis for contamination identification
- Surface analysis
- Trace bulk impurity analysis
Applications
- Silicon (amorphous, single crystal, polycrystalline, solar grade, and metallurgic grade)
- Sputtering targets (eAZO, CuGa, CuIn, In, CdS, and Mo)
- Glass and quartz
- Solid and flexible polymers (PP, PVC, PFE, PTFE and O-rings)
- Metal-sacked supports
- Low-k and high-k materials
- Aluminum, alumina, and anodized coating
- Various metals and alloys used for electric contact or interconnect (Al, Cu, Ag …)
- Refectory materials such as diamond, graphite, SiC, and Si3N4
- CMP pads
- Chemical powders
- NiP and hard disks
- Light emitting diodes (LEDs), capacitors, resistors, sensors, and small medical devices.
- Flat panel displays
- Bonding wires, lead frame, solder balls, masks and final testing probes
- Others
Analytical Metrology
- Glow discharge optical emission spectroscopy (GD-OES)
- Inductively coupled plasma mass spectrometry (ICP-MS)
- Inductively coupled plasma optical emission spectroscopy (ICP-OES)
- Laser ablation ICP mass spectrometry (LA ICP-MS)
- Energy dispersive spectroscopy (SEM-EDS)
- Secondary ion mass spectrometry (SIMS)
- UV/Vis spectroscopy
- X-ray fluorescence (XRF)
- Auger (AES)
- ESCA/XPS
- Interstitial gas analysis
- Minority carrier lifetime measurement (MCL)
- Rutherford backscattering spectroscopy (RBS)
- Time of flight secondary ion mass spectrometry (TOF-SIMS)
- XRD, TXRF, and X-ray imaging
Application Notes
| Thermal desorption gas chromatography (TD GC-MS) | |
|---|---|
| APP0313 SARIS Material Analysis | |
| APP0353 Organic and Inorganic Identification | |
| APP0394 Alpha Particle Emissivity Counting | |
| APP0450 Advanced Elemental Depth Profiling | |
| APP0455 GD-OES for Element Survey Depth Profiling | |
| APP0466 Contamination Identifictation |
Interested in our bulk material testing services?
From straightforward compressed gas analysis, to air sampling and customized wet-chemical digestion schemes, our world-leading resources are the perfect fit for your unique needs.