Documentation Library [ Return to References ]
Using novel spectroscopy and spectrometry techniques for the quantitative analysis of photovoltaic thin films and materials
Evaluation of Impurities in High-K and Low-K Thin Films Produced from Advanced Precursor Materials
Analytical Insight, 2009
Non-Traditional Spectroscopy for Analysis of Semiconductor and Photovoltaic Thin Films Materials
Fuhe Li, Scott Anderson
International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009
Using GD-OES to Characterize Challenging Thin-Films and Advanced Materials
Fuhe Li
Analytical Insight, 2008
Dose Measurement via SIMS Becomes Obsolete as use of Ultra Low Energy Grows
Fuhe Li, Scott Anderson
Analytical Insight, 2006
Thickness measurement of submonolayer native oxide films on silicon wafers
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