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Analysis of High-Precision TMAH Developer Solutions

Analytical Insight, 2009

Ion-Chromatographic Determination of Seven Common Anions in Electronic-Grade, Water Miscible Solvents

Lynn Vanatta

Journal of Chromatography A, 2008

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Accurate Analysis of Precursor Compounds

Phil Clancy, Scott Anderson

Semiconductor International, 2007

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Using SPV for Wet Deck Management? Beware of Unseen Contamination

Hugh Gotts

2007

Are Your Precursor Analyses Accurate? The Trouble with Hafnium Precursors

Dr. Phil Clancy and Dr. Scott Anderson

Analytical Insight, 2006

Optimizing the Selection an Supply of Hf Precursor Candidates for Gate Oxide

A. Soulet, L. Duquesne, G. Jursich, R. Inman, A. Misra,  N. Blasco, C. Lachaud, Y. Marot, R. Prunier,  M. Vautier, S. Anderson, P. Clancy, M. Havlicek

Semiconductor Fabtech, 2005

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Ion-pair Chromatography of Bis (Sodium-Sulfopropyl) Disulfide Brightener in Acidic Copper Plating Baths

Roger Palmans, S. Claes, Lynn Vanatta, David Coleman

Journal of Chromatography A, 2005

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Statistical Analysis of Externally Calibrated Measurement Systems

Lynn Vanatta, David Coleman

SPWCC, 2004

Determination of Chloride and Sulfate in Semiconductor-Grade Etchants Comprised of Acetic Acid, Nitric Acid and Phosphoric Acid

Lynn Vanatta, David Coleman, A. Woodruff

Journal of Chromatography A, 2003

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Reproducible Digestion Method for Ion-Chromatographic Analysis of Anions in 30% Hydrogen Peroxide

Lynn Vanatta, David Coleman

Journal of Chromatography A, 2002

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