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A Novel Approach to Silicon Carbide (SiC) Material Characterization
Fuhe Li, Wendy Rivello, Justin Laiduc
Analytical Insight, 2010
Using novel spectroscopy and spectrometry techniques for the quantitative analysis of photovoltaic thin films and materials
Comparison of Solar-Grade Silicon Analytical Methods for Metallic Contamination
Analytical Insight, 2009
Using GD-OES to Characterize Challenging Thin-Films and Advanced Materials
Fuhe Li
Analytical Insight, 2008
Dose Measurement via SIMS Becomes Obsolete as use of Ultra Low Energy Grows
Fuhe Li, Scott Anderson
Analytical Insight, 2006
Comparison of two Cryptand Separator Columns for the Determination of Trace Chloride in Semiconductor-Grade Nitric Acid
Predictive Analysis of Ceramics Holders for WF6 CVD Process
Laurent Doyen, Romain Joly, Maryse Bellmunt, Fuhe Li, Hervé Dubus
SPWCC, 2005
A New Approach to Chemical Analysis of Packaging/Assembly materials: SARIS™ Laser Ablation ICP-MS
Fuhe Li, Scott Anderson
IEEE/SEMI International Electronics Manufacturing Technology Symposium, 2004
Using Direct Solid Sampling ICP Mass Spectrometry to Complement SEM-EDX and SIMS in Characterizing Semiconductor Materials
Fuhe Li, Scott Anderson
Characterization and Metrology for ULSI, 2003
Process Compatibility Parameters for Wet Bench Plastic Materials
Archibald Tewarson, Avtar Jassal, Latif Ahmed, Mark Camenzind
International SEMATECH, 1998
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