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Analysis of High-Precision TMAH Developer Solutions

Analytical Insight, 2009

Non-Traditional Spectroscopy for Analysis of Semiconductor and Photovoltaic Thin Films Materials

Fuhe Li, Scott Anderson

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009

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Tool Optimization for Improving Productivity and Yields

Victor Chia, Fuhe Li

Fab Engineering and Operations, 2008

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Using GD-OES to Characterize Challenging Thin-Films and Advanced Materials

 Fuhe Li

Analytical Insight, 2008

Ion-Chromatographic Determination of Seven Common Anions in Electronic-Grade, Water Miscible Solvents

Lynn Vanatta

Journal of Chromatography A, 2008

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Accurate Analysis of Precursor Compounds

Phil Clancy, Scott Anderson

Semiconductor International, 2007

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Calibration, Uncertainty, and Recovery in the Chromatographic Sciences

Lynn Vanatta, David Coleman

Journal of Chromatography A, 2007

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Don’t Forget the Edge! Significance of VPD ICP-MS Edge Exclusion

Annie Watts, Carolyn Vercell

Analytical Insight, 2007

Airborne Urea Sampling and Analysis

Dr. Dan Cowles, Dr. Mary Havlicek, Lynn Vanatta, Piyamit Chitrathorn

Analytical Insight, 2007

Using SPV for Wet Deck Management? Beware of Unseen Contamination

Hugh Gotts

2007