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Bulk Material Testing

Solid bulk materials can be evaluated at Balazs NanoAnalysis in three dimensions at both compositional and trace levels. The materials can be in the forms of ingot, wafer, coupon, chunk, small electric device, wire, or powder. Since 1975 We have experience characterizing a variety of bulk materials, both inorganic and organic in nature, for semiconductor, photovoltaic, disk drive, nanotech, defense, and biomedical industries.

Provide testing for

  • Compositional analysis
  • Depth profiling, line scan and three-dimensional mapping
  • Microscopic or local analysis for contamination identification
  • Surface analysis
  • Trace bulk impurity analysis

Applications

  • Silicon (amorphous, single crystal, polycrystalline, solar grade, and metallurgic grade)
  • Sputtering targets (eAZO, CuGa, CuIn, In, CdS, and Mo)
  • Glass and quartz
  • Solid and flexible polymers (PP, PVC, PFE, PTFE and O-rings)
  • Metal-sacked supports
  • Low-k and high-k materials
  • Aluminum, alumina, and anodized coating
  • Various metals and alloys used for electric contact or interconnect (Al, Cu, Ag …)
  • Refectory materials such as diamond, graphite, SiC, and Si3N4
  • CMP pads
  • Chemical powders
  • NiP and hard disks
  • Light emitting diodes (LEDs), capacitors, resistors, sensors, and small medical devices…
  • Flat panel displays
  • Bonding wires, lead frame, solder balls, masks and final testing probes
  • Others

Analytical Metrology

  • Glow discharge optical emission spectroscopy (GD-OES)
  • Inductively coupled plasma mass spectrometry (ICP-MS)
  • Inductively coupled plasma  optical emission spectroscopy (ICP-OES)
  • Laser ablation ICP mass spectrometry (LA ICP-MS)
  • Energy dispersive spectroscopy (SEM-EDS)
  • Secondary ion mass spectrometry (SIMS)
  • UV/Vis spectroscopy
  • X-ray fluorescence (XRF)
  • Auger (AES)
  • ESCA/XPS
  • Interstitial gas analysis
  • Minority carrier lifetime measurement (MCL)
  • Rutherford backscattering spectroscopy (RBS)
  • Time of flight secondary ion mass spectrometry (TOF-SIMS)
  • XRD, TXRF, and X-ray imaging

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Technical Information

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Phone: 510 624 4000

Fax: 510 657 2292

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Request for Analysis

Please download and complete the appropriate RFA. Submit this to info@Balazs.com for a quote or include it with your samples for an analysis.